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MASTER NANOTECH
Parcours international Nanotech
MASTER NANOTECH
MASTER NANOTECH

> Formation

Physique et applications de la microscopie avancée

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Objectifs

To give an overview of the fundamentals of scanning-probe microscopy (STM, AFM, Near-Field optics) and of their place in the present development of nanoscience and nanotechnology.

Contenu

Courses

  • Architecture of a Scanning-Probe Microscope
    • General concepts
    • Instrumental aspects: displacements on the nanometer scale, regulation
  • Scanning Tunnelling Microscopy (STM)
    • Principles of STM
    • STM imaging
    • STM spectroscopy
  • Atomic-Force Microscopy (AFM)
    • The different operation modes
    • Electric-Force Microscopy (EFM) and Nanoelectronics
    • Detection of ultrasmall forces
  • Introduction to Near-field Scanning Optical Microscopy (NSOM)
    • Key concepts in near-field optics
    • Sub-wavelength photonics
    • Plasmonics and addressing of single nano-objects
  • Nanomanipulation by means of Scanning-Probe Microscopy
    • Quantum corrals, AFM nanolithography, optical nano-tweezers...

Exercises and Laboratories

None

Informations complémentaires

Related courses
Necessary conditions : none
Preparation for : none

Bibliographie

  • R. Wiesendanger, Scanning probe microscopy : methods and applications, Cambridge University Press (1994).
  • C. J. Chen, Introduction to scanning tunneling microscopy, Oxford series in optical and imaging techniques, Oxford University Press (1993).

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mise à jour le 23 janvier 2019

Mise à jour

4/11/11
Grenoble INP Institut d'ingénierie Univ. Grenoble Alpes