Advanced microscopy
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Number of hours
- Lectures : 20
- Tutorials : 6
ECTS : 2
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Goals
To give an overview of the fundamentals of scanning-probe microscopy (STM, AFM, Near-Field optics) and of their place in the present development of nanoscience and nanotechnology.
Content Courses
- Architecture of a Scanning-Probe Microscope
- Instrumental aspects: displacements on the nanometer scale, regulation
- Scanning Tunnelling Microscopy (STM)
- Atomic-Force Microscopy (AFM)
- The different operation modes
- Electric-Force Microscopy (EFM) and Nanoelectronics
- Detection of ultrasmall forces
- Introduction to Near-field Scanning Optical Microscopy (NSOM)
- Key concepts in near-field optics
- Plasmonics and addressing of single nano-objects
- Nanomanipulation by means of Scanning-Probe Microscopy
- Quantum corrals, AFM nanolithography, optical nano-tweezers...
Exercises and Laboratories None
Additional Information Related courses
Necessary conditions : none
Preparation for : none
Bibliography - R. Wiesendanger, Scanning probe microscopy : methods and applications, Cambridge University Press (1994).
- C. J. Chen, Introduction to scanning tunneling microscopy, Oxford series in optical and imaging techniques, Oxford University Press (1993).
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Date of update September 10, 2019
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